SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Flat Panel Display Technology and Display Metrology II - Standard illumination source for the evaluation of display measurement methods and instruments
Libert, John M., Boynton, Paul A., Kelley, Edward F., Brown, Steven W., Ohno, Yoshihiro, Manoocheri, Farshid, Kelley, Edward F., Voutsas, Apostolos T.Volume:
4295
Year:
2001
Language:
english
DOI:
10.1117/12.424882
File:
PDF, 1.06 MB
english, 2001