Adaptation of admittance analysis to extract interface...

Materials Science in Semiconductor Processing 2015 / 12 Vol. 40

Adaptation of admittance analysis to extract interface traps of a-Si:H/c-Si heterojunctions

Menda, Ugur Deneb, Özdemir, Orhan
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Volume:
40
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2015.06.074
Date:
December, 2015
File:
PDF, 1.07 MB
english, 2015
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