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Reactive ion beam etching of fused silica using vertical lamellar patterns of PS-b-PMMA diblock copolymer masks
Zajadacz, Joachim, Lorenz, Pierre, Frost, Frank, Fechner, Renate, Steinberg, Christian, Scheer, Hella-Christin, Zimmer, KlausVolume:
141
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2015.04.032
Date:
June, 2015
File:
PDF, 1.59 MB
english, 2015