Impact of proton fluence on DC and trapping characteristics...

Solid-State Electronics 2015 / 11 Vol. 113

Impact of proton fluence on DC and trapping characteristics in InAlN/GaN HEMTs

Rossetto, I., Rampazzo, F., Gerardin, S., Meneghini, M., Bagatin, M., Zanandrea, A., Dua, C., di Forte-Poisson, M.-A., Aubry, R., Oualli, M., Delage, S.L., Paccagnella, A., Meneghesso, G., Zanoni, E.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
113
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2015.05.013
Date:
November, 2015
File:
PDF, 795 KB
english, 2015
Conversion to is in progress
Conversion to is failed