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Microelectronics Reliability 2015 / 7

Time-domain viscoelastic constitutive model based on concurrent fitting of frequency-domain characteristics

Chiu, Tz-Cheng, Lee, Bo-Sheng, Huang, Dong-Yi, Yang, Yu-Ting, Tseng, Yi-Hsiu
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.07.031
Date:
July, 2015
File:
PDF, 1.51 MB
english, 2015
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