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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Polarization Analysis and Measurement IV - Near-infrared imaging polarimetry
Goldstein, Dennis H., Chenault, David B., Gulley, Michael G., Spradley, Kevin D., Goldstein, Dennis H., Chenault, David B., Egan, Walter G., Duggin, Michael J.Volume:
4481
Year:
2002
Language:
english
DOI:
10.1117/12.452878
File:
PDF, 1.21 MB
english, 2002