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SPIE Proceedings [SPIE Optics & Photonics - San Diego, CA (Sunday 13 August 2006)] Developments in X-Ray Tomography V - Tomographic analysis and FE-simulations of MMC-microstructures under load
Crostack, Horst-Artur, Nellesen, Jens, Fischer, Gottfried, Schmauder, Siegfried, Weber, Ulrich, Beckmann, Felix, Bonse, UlrichVolume:
6318
Year:
2006
Language:
english
DOI:
10.1117/12.680493
File:
PDF, 1.88 MB
english, 2006