SPIE Proceedings [SPIE Optical Instrumentation & Systems Design - Glasgow, United Kingdom (Sunday 12 May 1996)] Specification, Production, and Testing of Optical Components and Systems - Statistical tolerancing for optics
Forse, David P., Gee, Anthony E., Houee, Jean-FrancoisVolume:
2775
Year:
1996
Language:
english
DOI:
10.1117/12.246746
File:
PDF, 387 KB
english, 1996