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Generation of Misfit Dislocations in Si 1- x Ge x /Si Heterostructures
Fukuda, Yukio, Kohama, Yoshitaka, Seki, Masahiko, Ohmachi, YoshiroVolume:
28
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.28.L19
Date:
January, 1989
File:
PDF, 769 KB
1989