A New Approach to Model the Effect of Topology on Testing...

Journal of Electronic Testing 2015 / 6 Vol. 31; Iss. 3

A New Approach to Model the Effect of Topology on Testing Using Boundary Scan

Fotovatikhah, Farnaz, Naraghi, Bahareh, Tavakoli, Fatemeh, Ghadiry, Mahdiar
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Volume:
31
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-015-5530-8
Date:
June, 2015
File:
PDF, 1.16 MB
english, 2015
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