[IEEE 7th International Conference on Solid-State and...

  • Main
  • [IEEE 7th International Conference on...

[IEEE 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Beijing, China (Oct. 18-21, 2004)] Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Advanced Cu barrier/seed development for 65nm technology beyond

Peijun Ding,, Gopalraja, P., Jianming Fu,, Jick Yu,, Zheng Xu,, Fusen Chen,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
1
Year:
2004
Language:
english
DOI:
10.1109/ICSICT.2004.1435053
File:
PDF, 814 KB
english, 2004
Conversion to is in progress
Conversion to is failed