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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Remote Sensing System Engineering V - Pattern recognition applied to infrared images for early alerts in fog
Ardanuy, Philip E., Puschell, Jeffery J., Boucher, Vincent, Marchetti, Mario, Dumoulin, Jean, Cord, AurélienVolume:
9223
Year:
2014
Language:
english
DOI:
10.1117/12.2061779
File:
PDF, 793 KB
english, 2014