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SPIE Proceedings [SPIE MOEMS-MEMS 2006 Micro and Nanofabrication - San Jose, CA (Saturday 21 January 2006)] MOEMS Display, Imaging, and Miniaturized Microsystems IV - Perspective of MEMS based raster scanning display and its requirements for success
Park, Yong-Hwa, Lee, Jin-Ho, Shin, Seong-Ho, Sunu, John, Ürey, Hakan, Dickensheets, David L., Gogoi, Bishnu P.Volume:
6114
Year:
2006
Language:
english
DOI:
10.1117/12.659058
File:
PDF, 411 KB
english, 2006