[ACM Press the 2005 ACM SIGMETRICS international conference - Banff, Alberta, Canada (2005.06.06-2005.06.10)] Proceedings of the 2005 ACM SIGMETRICS international conference on Measurement and modeling of computer systems - SIGMETRICS '05 - Efficient algorithms for large-scale topology discovery
Donnet, Benoit, Raoult, Philippe, Friedman, Timur, Crovella, MarkYear:
2005
Language:
english
DOI:
10.1145/1064212.1064256
File:
PDF, 284 KB
english, 2005