[ACM Press the 42nd annual conference - San Diego, California, USA (2005.06.13-2005.06.17)] Proceedings of the 42nd annual conference on Design automation - DAC '05 - A design platform for 90-nm leakage reduction techniques
Royannez, Philippe, Dong, Julie, Scott, D., Pitts, B., Raibaut, Claudine, Ko, Uming, Mair, Hugh, Dahan, Franck, Wagner, Mike, Streeter, Mark, Bouetel, Laurent, Blasquez, Joel, Clasen, H., Semino, G.Year:
2005
Language:
english
DOI:
10.1145/1065579.1065722
File:
PDF, 625 KB
english, 2005