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[ACM Press the 2008 workshop - Ischia, Italy (2008.05.05-2008.05.07)] Proceedings of the 2008 workshop on Radiation effects and fault tolerance in nanometer technologies - WREFT '08 - Analyzing the effects of the granularity of recomputation based techniques to cope with radiation induced soft errors
Lisboa, Carlos A. L., Kastensmidt, Fernanda G. L., Carro, LuigiYear:
2008
Language:
english
DOI:
10.1145/1366224.1366226
File:
PDF, 370 KB
english, 2008