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[ACM Press the 45th annual conference - Anaheim, California (2008.06.08-2008.06.13)] Proceedings of the 45th annual conference on Design automation - DAC '08 - Partial order reduction for scalable testing of systemC TLM designs
Kundu, Sudipta, Ganai, Malay, Gupta, RajeshYear:
2008
Language:
english
DOI:
10.1145/1391469.1391706
File:
PDF, 415 KB
english, 2008