Layout-aware scan chain reorder for launch-off-shift transition test coverage
Wang, Sying-Jyan, Peng, Kuo-Lin, Hsiao, Kuang-Cyun, Li, Katherine Shu-MinVolume:
13
Language:
english
Journal:
ACM Transactions on Design Automation of Electronic Systems
DOI:
10.1145/1391962.1391972
Date:
September, 2008
File:
PDF, 1.48 MB
english, 2008