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[ACM Press Companion to the 23rd ACM SIGPLAN conference - Nashville, TN, USA (2008.10.19-2008.10.23)] Companion to the 23rd ACM SIGPLAN conference on Object oriented programming systems languages and applications - OOPSLA Companion '08 - NOAO imaging meta data quality improvement
Lowry, Sonya J., Warner, Phillip B., Deaubl, EvanYear:
2008
Language:
english
DOI:
10.1145/1449814.1449820
File:
PDF, 381 KB
english, 2008