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[ACM Press the 2009 ACM symposium - Honolulu, Hawaii (2009.03.08-2008.03.12)] Proceedings of the 2009 ACM symposium on Applied Computing - SAC '09 - Enhanced lattice-based adaptive random testing
Chen, T. Y., Huang, De Hao, Kuo, F.-C., Merkel, R. G., Mayer, JohannesYear:
2009
Language:
english
DOI:
10.1145/1529282.1529376
File:
PDF, 1.89 MB
english, 2009