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Artefacts in geometric phase analysis of compound materials
Peters, Jonathan J.P., Beanland, Richard, Alexe, Marin, Cockburn, John W., Revin, Dmitry G., Zhang, Shiyong Y., Sanchez, Ana M.Volume:
157
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2015.05.020
Date:
October, 2015
File:
PDF, 1.95 MB
english, 2015