Structural Study of the Annealing of Alkylsiloxane Self-Assembled Monolayers on Silicon by High-Resolution X-ray Diffraction
Murphy, M. A., Nordgren, C. E., Fischetti, R. F., Blasie, J. K., Peticolas, L. J., Bean, J. C.Volume:
99
Language:
english
Journal:
The Journal of Physical Chemistry
DOI:
10.1021/j100038a040
Date:
September, 1995
File:
PDF, 2.59 MB
english, 1995