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Characterization of Polystyrene on Etched Silver Using Ion Scattering and X-ray Photoelectron Spectroscopy: Correlation of Secondary Ion Yield in Time-of-Flight SIMS with Surface Coverage
Muddiman, David C., Brockman, Adam H., Proctor, Andrew, Houalla, Marwan, Hercules, David M.Volume:
98
Language:
english
Journal:
The Journal of Physical Chemistry
DOI:
10.1021/j100095a044
Date:
November, 1994
File:
PDF, 696 KB
english, 1994