Characterization of evaporated silicon and silicon monoxide...

Journal of Physical Chemistry 1992 / 02 Vol. 96; Iss. 4

Characterization of evaporated silicon and silicon monoxide films by inelastic electron tunneling spectroscopy

Higo, Morihide, Nishino, Kouichi, Kamata, Satsuo
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Volume:
96
Language:
english
Journal:
The Journal of Physical Chemistry
DOI:
10.1021/j100183a062
Date:
February, 1992
File:
PDF, 938 KB
english, 1992
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