Free ion yields in liquids exposed to synchrotron x-rays
Holroyd, Richard A., Sham, T. K., Yang, B. X., Feng, X. H.Volume:
96
Language:
english
Journal:
The Journal of Physical Chemistry
DOI:
10.1021/j100197a056
Date:
September, 1992
File:
PDF, 459 KB
english, 1992