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Characterization of AgGa 0.5 In 0.5 Se 2 thin films deposited by electron-beam technique
Karaagac, H, Kaleli, M, Parlak, MVolume:
42
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/42/16/165413
Date:
August, 2009
File:
PDF, 394 KB
english, 2009