Tip loading effects on AFM-based transport measurements of...

Nanotechnology 2013 / 10 Vol. 24; Iss. 39

Tip loading effects on AFM-based transport measurements of metal–oxide interfaces

Hou, Jiechang, Rouxel, Baptiste, Qin, Wei, Nonnenmann, Stephen S, Bonnell, Dawn A
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Volume:
24
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/24/39/395703
Date:
October, 2013
File:
PDF, 644 KB
english, 2013
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