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Three-dimensional reciprocal space mapping with a two-dimensional detector as a low-latency tool for investigating the influence of growth parameters on defects in semipolar GaN
Bauer, Sondes, Lazarev, Sergey, Bauer, Martin, Meisch, Tobias, Caliebe, Marian, Holý, Václav, Scholz, Ferdinand, Baumbach, TiloVolume:
48
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576715009085
Date:
August, 2015
File:
PDF, 1.82 MB
english, 2015