SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Stray Radiation in Optical Systems III - Measurement and analysis of scatter from rough surfaces
Stover, John C., Bernt, Marvin L., Church, Eugene L., Breault, Robert P.Volume:
2260
Year:
1994
Language:
english
DOI:
10.1117/12.189225
File:
PDF, 896 KB
english, 1994