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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Roughness effects in the infrared reflectance of thick 3C-SiC films grown on Si substrates
Pascual, J., Ben el Mekki, M., Arnaud, G., Camassel, J., Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
2648
Year:
1995
Language:
english
DOI:
10.1117/12.226154
File:
PDF, 289 KB
english, 1995