Deep centers in TiO2-Si structures
Kalygina, V. M., Petrova, Yu. S., Prudaev, I. A., Tolbanov, O. P., Tsupiy, S. Yu.Volume:
49
Language:
english
Journal:
Semiconductors
DOI:
10.1134/S1063782615080102
Date:
August, 2015
File:
PDF, 591 KB
english, 2015