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[ACM Press the 2005 conference - Shanghai, China (2005.01.18-2005.01.21)] Proceedings of the 2005 conference on Asia South Pacific design automation - ASP-DAC '05 - Yield driven gate sizing for coupling-noise reduction under uncertainty
Sinha, Debjit, Zhou, HaiYear:
2005
Language:
english
DOI:
10.1145/1120725.1120803
File:
PDF, 162 KB
english, 2005