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[ACM Press the 2008 ACM symposium - Fortaleza, Ceara, Brazil (2008.03.16-2008.03.20)] Proceedings of the 2008 ACM symposium on Applied computing - SAC '08 - Towards design patterns for ontology alignment
Scharffe, François, Euzenat, Jérôme, Fensel, DieterYear:
2008
Language:
english
DOI:
10.1145/1363686.1364236
File:
PDF, 176 KB
english, 2008