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[ACM Press the twenty-first annual symposium - Gramado, Brazil (2008.09.01-2008.09.04)] Proceedings of the twenty-first annual symposium on Integrated circuits and system design - SBCCI '08 - Encountering gate oxide breakdown with shadow transistors to increase reliability
Cornelius, Claas, Sill, Frank, Sämrow, Hagen, Salzmann, Jakob, Timmermann, Dirk, da Silva, DiógenesYear:
2008
Language:
english
DOI:
10.1145/1404371.1404407
File:
PDF, 403 KB
english, 2008