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[ACM Press the 46th Annual Design Automation Conference - San Francisco, California (2009.07.26-2009.07.31)] Proceedings of the 46th Annual Design Automation Conference on ZZZ - DAC '09 - Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence
Veetil, Vineeth, Sylvester, Dennis, Blaauw, David, Shah, Saumil, Rochel, SteffenYear:
2009
Language:
english
DOI:
10.1145/1629911.1629956
File:
PDF, 453 KB
english, 2009