[ACM Press the 20th ACM international conference - Glasgow,...

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[ACM Press the 20th ACM international conference - Glasgow, Scotland, UK (2011.10.24-2011.10.28)] Proceedings of the 20th ACM international conference on Information and knowledge management - CIKM '11 - Detection of text quality flaws as a one-class classification problem

Anderka, Maik, Stein, Benno, Lipka, Nedim
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Year:
2011
Language:
english
DOI:
10.1145/2063576.2063954
File:
PDF, 368 KB
english, 2011
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