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[IEEE 31st European Solid-State Device Research Conference - Nuremberg, Germany (2001.9.11-2001.9.13)] 31st European Solid-State Device Research Conference - Characterization and simulation of the parasitic BJT in 0.1um partially-depleted SOI devices
Fenouillet-Beranger, C., Faynot, O., de Pontcharra, J.d., Tabone, C., Lecarval, G., Grouillet, A., Pelloie, J.L., Balestra, D.Year:
2001
DOI:
10.1109/essderc.2001.195270
File:
PDF, 280 KB
2001