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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 7 February 2015)] Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications VIII - Terahertz wavefront assessment based on 2D electro-optic imaging
Sadwick, Laurence P., Yang, Tianxin, Cahyadi, Harsono, Ichikawa, Ryuji, Degert, Jérôme, Freysz, Eric, Yasui, Takeshi, Abraham, EmmanuelVolume:
9362
Year:
2015
Language:
english
DOI:
10.1117/12.2078450
File:
PDF, 878 KB
english, 2015