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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 1 August 2010)] Developments in X-Ray Tomography VII - Precise 3D dimensional metrology using high-resolution x-ray computed tomography (μCT)
Stock, Stuart R., Brunke, Oliver, Santillan, Javier, Suppes, AlexanderVolume:
7804
Year:
2010
Language:
english
DOI:
10.1117/12.861354
File:
PDF, 9.97 MB
english, 2010