[ACM Press the 2005 ACM symposium - St. Louis, Missouri (2005.05.14-2005.05.15)] Proceedings of the 2005 ACM symposium on Software visualization - SoftVis '05 - CVSscan
Voinea, Lucian, Telea, Alex, van Wijk, Jarke J.Year:
2005
Language:
english
DOI:
10.1145/1056018.1056025
File:
PDF, 1.09 MB
english, 2005