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[ACM Press the 36th ACM/IEEE conference - New Orleans, Louisiana, United States (1999.06.21-1999.06.25)] Proceedings of the 36th ACM/IEEE conference on Design automation conference - DAC '99 - Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings
Tan, Xiang-Dong, Shi, C.-J. Richard, Lungeanu, Dragos, Lee, Jyh-Chwen, Yuan, Li-PenYear:
1999
Language:
english
DOI:
10.1145/309847.309880
File:
PDF, 92 KB
english, 1999