An exact solution to the minimum size test pattern problem

ACM Transactions on Design Automation of Electronic Systems 2001 / 10 Vol. 6; Iss. 4

An exact solution to the minimum size test pattern problem

Flores, Paulo F., Neto, Horácio C., Marques-Silva, João P.
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Volume:
6
Language:
english
Journal:
ACM Transactions on Design Automation of Electronic Systems
DOI:
10.1145/502175.502186
Date:
October, 2001
File:
PDF, 128 KB
english, 2001
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