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SPIE Proceedings [SPIE Refractometry: International Conference - Warsaw, Poland (Monday 16 May 1994)] Refractometry - Refractive index and light scattering models in the volume scattering function measurement

Mroczka, Janusz, Parol, Marian, Wysoczanski, Dariusz, Pluta, Maksymilian, Szyjer, Mariusz
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Volume:
2208
Year:
1995
Language:
english
DOI:
10.1117/12.213205
File:
PDF, 748 KB
english, 1995
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