Test chip experimental results on high-level structural...

ACM Transactions on Design Automation of Electronic Systems 2005 / 10 Vol. 10; Iss. 4

Test chip experimental results on high-level structural test

Al-Yamani, Ahmad A., McCluskey, Edward J.
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Volume:
10
Language:
english
Journal:
ACM Transactions on Design Automation of Electronic Systems
DOI:
10.1145/1109118.1109125
Date:
October, 2005
File:
PDF, 402 KB
english, 2005
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