[ACM Press the 2nd international workshop - Baltimore, MD (2005.06.17-2005.06.17)] Proceedings of the 2nd international workshop on Computer vision meets databases - CVDB '05 - On the impact of outliers on high-dimensional data analysis methods for face recognition
Berrani, Sid-Ahmed, Garcia, ChristopheYear:
2005
Language:
english
DOI:
10.1145/1160939.1160952
File:
PDF, 167 KB
english, 2005