A self-organizing defect tolerant SIMD architecture
Patwardhan, Jaidev, Dwyer, Chris, Lebeck, Alvin R.Volume:
3
Language:
english
Journal:
ACM Journal on Emerging Technologies in Computing Systems
DOI:
10.1145/1265949.1265956
Date:
July, 2007
File:
PDF, 1.19 MB
english, 2007