Probabilistic transfer matrices in symbolic reliability...

Probabilistic transfer matrices in symbolic reliability analysis of logic circuits

Krishnaswamy, Smita, Viamontes, George F., Markov, Igor L., Hayes, John P.
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Volume:
13
Language:
english
Journal:
ACM Transactions on Design Automation of Electronic Systems
DOI:
10.1145/1297666.1297674
Date:
January, 2008
File:
PDF, 906 KB
english, 2008
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