Probabilistic transfer matrices in symbolic reliability analysis of logic circuits
Krishnaswamy, Smita, Viamontes, George F., Markov, Igor L., Hayes, John P.Volume:
13
Language:
english
Journal:
ACM Transactions on Design Automation of Electronic Systems
DOI:
10.1145/1297666.1297674
Date:
January, 2008
File:
PDF, 906 KB
english, 2008