[ACM Press the 9th ACM/IEEE International Conference -...

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[ACM Press the 9th ACM/IEEE International Conference - Stockholm, Sweden (2010.04.12-2010.04.16)] Proceedings of the 9th ACM/IEEE International Conference on Information Processing in Sensor Networks - IPSN '10 - Diagnostic powertracing for sensor node failure analysis

Khan, Mohammad Maifi Hasan, Han, Jiawei, Jin, Xin, Le, Hieu K., LeMay, Michael, Moinzadeh, Parya, Wang, Lili, Yang, Yong, Noh, Dong K., Abdelzaher, Tarek, Gunter, Carl A.
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Year:
2010
Language:
english
DOI:
10.1145/1791212.1791227
File:
PDF, 1.54 MB
english, 2010
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