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A regression test selection technique for embedded software
Biswas, Swarnendu, Mall, Rajib, Satpathy, ManoranjanVolume:
13
Language:
english
Journal:
ACM Transactions on Embedded Computing Systems
DOI:
10.1145/2539036.2539043
Date:
December, 2013
File:
PDF, 3.55 MB
english, 2013