In situ affect detection in mobile devices
Adibuzzaman, Mohammad, Jain, Niharika, Steinhafel, Nicholas, Haque, Munir, Ahmed, Ferdaus, Ahamed, Sheikh, Love, RichardVolume:
13
Language:
english
Journal:
ACM SIGAPP Applied Computing Review
DOI:
10.1145/2577554.2577562
Date:
December, 2013
File:
PDF, 905 KB
english, 2013